Fundamentals of atomic force microscopy part 1. : foundations Reifenberger, Ronald

By: Material type: TextTextLanguage: English Publication details: World Scientific 2016DDC classification:
  • T16 REI 502.82
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Holdings
Item type Current library Call number Status Barcode
Books Books Nalanda Library Circulation Books 502.82 T16 REI (Browse shelf(Opens below)) Available 18608
Total holds: 0

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