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Lock-in thermography: basics and use for evaluating electronic devices and materials

Breitenstein, Otwin; Warta, Wilhelm; Langenkamp, Martin

Lock-in thermography: basics and use for evaluating electronic devices and materials - 2nd ed.. - Springer 2010

ISBN: 9783642024160

Dewey Class. No.: 621.382 / T10 BRE W

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