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Scanning electron microscopy and x-ray microanalysis

Goldstein, Joseph I.

Scanning electron microscopy and x-ray microanalysis - 4th ed. - New York Springer 2017 - 550p.

ISBN: 9781493982691

Subjects--Topical Terms:
Miscellany

Dewey Class. No.: 502.825 / T17 GOL.N

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