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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits Bushnell, Michael L. and Agrawal, Vishwani D.

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Material type: Text

TextLanguage: English Publication details: Springer 2000DDC classification:

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Item type	Current library	Call number	Status	Date due	Barcode	Item holds
Books	Nalanda Library Circulation Books	621.395 T00 BUS.A (Browse shelf(Opens below))	Available		17900
Books	Nalanda Library Circulation Books	621.395 T00 BUS.A (Browse shelf(Opens below))	Available		18027

Total holds: 0

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Previous	621.395 N98 TAU.N Fundamentals of modern VLSI devices	621.395 N98 TAU.N Fundamentals of modern VLSI devices	621.395 T00 BUS.A Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits	621.395 T00 BUS.A Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits	621.395 T00 UYE Fit course in digital systems design :an integrated approach	621.395 T00 UYE Fit course in digital systems design :an integrated approach	621.395 T02 UYE Introduction to VLSI Circuits and Systems	Next

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