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Fundamentals of atomic force microscopy part 1. : foundations Reifenberger, Ronald

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TextLanguage: English Publication details: World Scientific 2016DDC classification:

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Item type	Current library	Call number	Status	Date due	Barcode	Item holds
Books	Nalanda Library Circulation Books	502.82 T16 REI (Browse shelf(Opens below))	Available		18608

Total holds: 0

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Previous	502.82 T05 VIL.R Scanning probe microsocopy characterization, nanofabrication and device application of functional materials	502.82 T06 SAM Scanning probe microscopies beyond imaging manipulation of molecules and nanostructures	502.82 T10 EAT.W Atomic force microscopy	502.82 T16 REI Fundamentals of atomic force microscopy part 1. : foundations	502.825 N93 FLE.H Scanning and transmission electron and microscopy	502.825 N98 REI Scanning electron microscopy : Physics of image formation and microanalysis	502.825 N98 WIE Scanning probe microscopy and spectroscopy : methods and applications	Next

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