Micromachining techniques and applications Dunham, Holly (Ed.)
Material type:
TextLanguage: English Publication details: N Y Research Press 2015DDC classification: - T15 DUN 621.3815
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| 621.3815 T14 GOE.C Testing for small delay defects in nanoscale CMOS intergrated circuits | 621.3815 T14 RAS Electronic devices and circuits | 621.3815 T14 SAG Principles of analog electronics | 621.3815 T15 DUN Micromachining techniques and applications | 621.3815 T15 FRA Design with operational amplifier and analog integrated circuits | 621.3815 T15 FRA Design with operational amplifier and analog integrated circuits | 621.3815 T15 FRA Design with operational amplifier and analog integrated circuits |
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