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Thin film materials stress, defect formation and surface evolution Freund, L. B. and Suresh S.

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TextLanguage: English Publication details: Cambridge 2009DDC classification:

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Item type	Current library	Call number	Status	Date due	Barcode	Item holds
Books	Nalanda Library Circulation Books	621.38152 T09 FRE.S (Browse shelf(Opens below))	Available		3192

Total holds: 0

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Previous	621.38152 T08 PIE Semiconductor device fundamentals	621.38152 T08 PIE Semiconductor device fundamentals	621.38152 T08 ROG Semiconductor nonocrystal quantum dots	621.38152 T09 FRE.S Thin film materials stress, defect formation and surface evolution	621.38152 T09 LI Optoelectronic devices	621.38152 T09 MIY.F Thin film shape memory alloys fundamentals and device applications	621.38152 T09 PRA.S Photonic crystals, theory, application	Next

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