Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Reference Books | Nalanda Library Reference | Reference | 621.38152 T08 PIE (Browse shelf(Opens below)) | Available | 6235 | ||
Books | Nalanda Library Circulation Books | 621.38152 T08 PIE (Browse shelf(Opens below)) | Checked out | 19/09/2024 | 3299 | ||
Books | Nalanda Library Circulation Books | 621.38152 T08 PIE (Browse shelf(Opens below)) | Available | 6236 | |||
Books | Nalanda Library Circulation Books | 621.38152 T08 PIE (Browse shelf(Opens below)) | Available | 6237 |
Total holds: 0
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621.38152 T08 PAV.S CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test | 621.38152 T08 PEL Evolution of thin film morphology | 621.38152 T08 PIE Semiconductor device fundamentals | 621.38152 T08 PIE Semiconductor device fundamentals | 621.38152 T08 PIE Semiconductor device fundamentals | 621.38152 T08 ROG Semiconductor nonocrystal quantum dots | 621.38152 T09 FRE.S Thin film materials stress, defect formation and surface evolution |
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