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Atomic force microscopy Eaton, Peter and West, Paul

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TextLanguage: English Publication details: Oxford 2010DDC classification:

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Item type	Current library	Call number	Status	Date due	Barcode	Item holds
Books	Nalanda Library Circulation Books	502.82 T10 EAT.W (Browse shelf(Opens below))	Available		6303

Total holds: 0

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Previous	502.82 N94 SAR Scanning force microscopy with applications to electric, magnetic, and atomic forces	502.82 T05 VIL.R Scanning probe microsocopy characterization, nanofabrication and device application of functional materials	502.82 T06 SAM Scanning probe microscopies beyond imaging manipulation of molecules and nanostructures	502.82 T10 EAT.W Atomic force microscopy	502.82 T16 REI Fundamentals of atomic force microscopy part 1. : foundations	502.825 N93 FLE.H Scanning and transmission electron and microscopy	502.825 N98 REI Scanning electron microscopy : Physics of image formation and microanalysis	Next

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