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Scanning electron microscopy : Physics of image formation and microanalysis Reimer, Ludwig

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Material type: Text

TextLanguage: English Publication details: Springer 1998Edition: 2nd rev. edDDC classification:

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Item type	Current library	Call number	Status	Date due	Barcode	Item holds
Books	Nalanda Library Circulation Books	502.825 N98 REI (Browse shelf(Opens below))	Available		6313

Total holds: 0

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Previous	502.82 T10 EAT.W Atomic force microscopy	502.82 T16 REI Fundamentals of atomic force microscopy part 1. : foundations	502.825 N93 FLE.H Scanning and transmission electron and microscopy	502.825 N98 REI Scanning electron microscopy : Physics of image formation and microanalysis	502.825 N98 WIE Scanning probe microscopy and spectroscopy : methods and applications	502.825 T04 MEY.H Scanning probe microscopy the lab on a tip	502.825 T07 SAR Exploring scanning probe microscopy with mathematica	Next

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