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Evolution of thin film morphology Pelliccione, Mathew and Lu, Toh-Ming

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Material type: Text

TextPublication details: Springer 2008DDC classification:

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Item type	Current library	Call number	Status	Date due	Barcode	Item holds
Books	Nalanda Library Circulation Books	621.38152 T08 PEL (Browse shelf(Opens below))	Checked out	15/01/2024	2981

Total holds: 0

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Previous	621.38152 T07 ALF.F Fundamentals of nanoscale film analysis	621.38152 T07 RAM Thin film metal oxides : fundamentals and applications in electronics and energy	621.38152 T08 PAV.S CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test	621.38152 T08 PEL Evolution of thin film morphology	621.38152 T08 PIE Semiconductor device fundamentals	621.38152 T08 PIE Semiconductor device fundamentals	621.38152 T08 PIE Semiconductor device fundamentals	Next

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