Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale

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TextLanguage: English Publication details: New York Springer 2007Description: 2v:980pISBN:

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Holdings
Item type	Current library	Collection	Call number	Vol info	Status	Barcode
Reference Books	Nalanda Library Reference	Reference	621.38152 T07 KAL.G (Browse shelf(Opens below))	Vol.1	Available	2992
Books	Nalanda Library Circulation Books		621.38152 T07 KAL.G (Browse shelf(Opens below))	Vol.2	Available	2993

Total holds: 0

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Previous	621.38152 T05 DAT Quantum transport: atom to transistor	621.38152 T06 STR.B Solid state electronic devices	621.38152 T06 STR.B Solid state electronic devices	621.38152 T07 KAL.G Scanning probe microscopy	621.38152 T08 PIE Semiconductor device fundamentals	621.38152 T08 PIE Semiconductor device fundamentals	621.38152 T09 SZE Semiconductor devices : physics and technology	Next

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