Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale

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TextLanguage: English Publication details: New York Springer 2007Description: 2v:980pISBN:

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Holdings
Item type	Current library	Collection	Call number	Vol info	Status	Barcode
Reference Books	Nalanda Library Reference	Reference	621.38152 T07 KAL.G (Browse shelf(Opens below))	Vol.1	Available	2992
Books	Nalanda Library Circulation Books		621.38152 T07 KAL.G (Browse shelf(Opens below))	Vol.2	Available	2993

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Previous	621.38152 T06 STR.B Solid state electronic devices	621.38152 T06 STR.B Solid state electronic devices	621.38152 T07 ALF.F Fundamentals of nanoscale film analysis	621.38152 T07 KAL.G Scanning probe microscopy	621.38152 T07 RAM Thin film metal oxides : fundamentals and applications in electronics and energy	621.38152 T08 PAV.S CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test	621.38152 T08 PEL Evolution of thin film morphology	Next

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