Breitenstein, Otwin; Warta, Wilhelm; Langenkamp, Martin <br/><br/>
Lock-in thermography: basics and use for evaluating electronic devices and materials 

 - 2nd ed.. 
 -  Springer  2010 
<br/><br/><label>ISBN: </label>9783642024160 
<br/><br/><label>Dewey Class. No.: </label>621.382  / T10 BRE W