Goldstein, Joseph; Newbury, Dale and others <br/><br/>
Scanning electron microscopy and X-ray microanalysis 

 - 3rd ed. 
 -  Springer  2003 
<br/><br/><label>ISBN: </label>9780306472923 
<br/><br/><label>Dewey Class. No.: </label>502.805  / T03 GOL N