Goldstein, Joseph I. <br/><br/>
Scanning electron microscopy and x-ray microanalysis 

 - 4th ed. 
 - New York  Springer  2017 
 - 550p. 
<br/><br/><label>ISBN: </label>9781493982691 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Miscellany
<br/><br/><label>Dewey Class. No.: </label>502.825  / T17 GOL.N