TY  - BOOK
AU  - Goldstein, Joseph I.
AU  - Newbury, Dale E.
AU  - Michael, Joseph R.
AU  - Ritchie, Nicholas W.M.
AU  - Scott, John Henry J.
AU  - Joy, David C.
TI  - Scanning electron microscopy and x-ray microanalysis
SN  - 9781493982691
U1  - 502.825 
PY  - 2017///
CY  - New York
PB  - Springer
KW  - Miscellany
ER  -