Goel, Sandeep K. and Chakrabarty, Krishnendu <br/><br/>
Testing for small delay defects in nanoscale CMOS intergrated circuits 
Goel, Sandeep K. and Chakrabarty, Krishnendu 
 -  CRC Press  2014 
<br/><br/><label>Dewey Class. No.: </label>621.3815  / T14 GOE.C