000 00430nam a2200121Ia 4500
008 230718s9999||||xx |||||||||||||| ||und||
041 _aeng
082 _bT00 BUS.A
_a621.395
100 _a Bushnell, Michael L. and Agrawal, Vishwani D.
245 0 _a Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
_c Bushnell, Michael L. and Agrawal, Vishwani D.
260 _b Springer
_c2000
942 _cBK
999 _c10866
_d10866