000 00386nam a2200133Ia 4500
008 231023s9999||||xx |||||||||||||| ||und||
020 _a9781571170460
041 _aeng
082 _a620.11278
_bT04 MOO
100 _aMoore, Patrick O; Jackson, Charles N and Sue Risk, C
_915332
245 0 _aNon destructive testing handbook: electronic testing
260 _bASN T
_c2004
942 _cBK
999 _c26354
_d26354