000 00413nam a2200121Ia 4500
008 230715s9999||||xx |||||||||||||| ||und||
041 _aeng
082 _a621.3815
_bT14 GOE.C
100 _aGoel, Sandeep K. and Chakrabarty, Krishnendu
_92961
245 0 _aTesting for small delay defects in nanoscale CMOS intergrated circuits
_cGoel, Sandeep K. and Chakrabarty, Krishnendu
260 _bCRC Press
_c2014
942 _cBK
999 _c8354
_d8354