CMOS SRAM circuit design and parametric test in nano-scaled technologies (Record no. 16110)

MARC details
000 -LEADER
fixed length control field 00439nam a2200121Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230721s9999||||xx |||||||||||||| ||und||
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title eng
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.38152
Item number T08 PAV.S
100 ## - MAIN ENTRY--AUTHOR NAME
Personal name Pavlov, Andrei and Sachdev, Manoj
245 #0 - TITLE STATEMENT
Title CMOS SRAM circuit design and parametric test in nano-scaled technologies
Remainder of title : process-aware SRAM design and test
Statement of responsibility, etc Pavlov, Andrei and Sachdev, Manoj
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Name of publisher Springer
Year of publication 2008
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Books
Holdings
Lost status Damaged status Permanent Location Current Location Shelving location Date acquired Cost, normal purchase price Full call number Accession Number Koha item type
    Nalanda Library Nalanda Library Circulation Books   495.00 621.38152 T08 PAV.S 8046 Books