CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test Pavlov, Andrei and Sachdev, Manoj

By: Material type: TextTextLanguage: English Publication details: Springer 2008DDC classification:
  • 621.38152 T08 PAV.S
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Item type Current library Call number Status Date due Barcode Item holds
Books Books Nalanda Library Circulation Books 621.38152 T08 PAV.S (Browse shelf(Opens below)) Available 8046
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