Testing for small delay defects in nanoscale CMOS intergrated circuits
Goel, Sandeep K. and Chakrabarty, Krishnendu
Testing for small delay defects in nanoscale CMOS intergrated circuits Goel, Sandeep K. and Chakrabarty, Krishnendu - CRC Press 2014
621.3815 / T14 GOE.C
Testing for small delay defects in nanoscale CMOS intergrated circuits Goel, Sandeep K. and Chakrabarty, Krishnendu - CRC Press 2014
621.3815 / T14 GOE.C