Testing for small delay defects in nanoscale CMOS intergrated circuits Goel, Sandeep K. and Chakrabarty, Krishnendu

By: Material type: TextTextLanguage: English Publication details: CRC Press 2014DDC classification:
  • 621.3815 T14 GOE.C
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Item type Current library Call number Status Date due Barcode Item holds
Books Books Nalanda Library Circulation Books 621.3815 T14 GOE.C (Browse shelf(Opens below)) Available 10099
Total holds: 0

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