Testing for small delay defects in nanoscale CMOS intergrated circuits (Record no. 8354)

MARC details
000 -LEADER
fixed length control field 00413nam a2200121Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230715s9999||||xx |||||||||||||| ||und||
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title eng
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.3815
Item number T14 GOE.C
100 ## - MAIN ENTRY--AUTHOR NAME
Personal name Goel, Sandeep K. and Chakrabarty, Krishnendu
245 #0 - TITLE STATEMENT
Title Testing for small delay defects in nanoscale CMOS intergrated circuits
Statement of responsibility, etc Goel, Sandeep K. and Chakrabarty, Krishnendu
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Name of publisher CRC Press
Year of publication 2014
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Books
Holdings
Lost status Damaged status Permanent Location Current Location Shelving location Date acquired Full call number Accession Number Koha item type
    Nalanda Library Nalanda Library Circulation Books   621.3815 T14 GOE.C 10099 Books