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CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test Pavlov, Andrei and Sachdev, Manoj

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Material type: Text

TextLanguage: English Publication details: Springer 2008DDC classification:

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Item type	Current library	Call number	Status	Date due	Barcode	Item holds
Books	Nalanda Library Circulation Books	621.38152 T08 PAV.S (Browse shelf(Opens below))	Available		8046

Total holds: 0

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Previous	621.38152 T06 STR.B Solid state electronic devices	621.38152 T07 ALF.F Fundamentals of nanoscale film analysis	621.38152 T07 RAM Thin film metal oxides : fundamentals and applications in electronics and energy	621.38152 T08 PAV.S CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test	621.38152 T08 PEL Evolution of thin film morphology	621.38152 T08 PIE Semiconductor device fundamentals	621.38152 T08 PIE Semiconductor device fundamentals	Next

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