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Testing for small delay defects in nanoscale CMOS intergrated circuits Goel, Sandeep K. and Chakrabarty, Krishnendu

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Material type: Text

TextLanguage: English Publication details: CRC Press 2014DDC classification:

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Item type	Current library	Call number	Status	Date due	Barcode	Item holds
Books	Nalanda Library Circulation Books	621.3815 T14 GOE.C (Browse shelf(Opens below))	Available		10099

Total holds: 0

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Previous	621.3815 T13 LIM Design for high performance, low power, and reliable 3D integrated circuits	621.3815 T13 LUN.J Near-equilibrium transport : fundamentals and applications	621.3815 T13 MOR.I Graphene, carbon nanotubes and nanostructures techniques and applications	621.3815 T14 GOE.C Testing for small delay defects in nanoscale CMOS intergrated circuits	621.3815 T14 RAS Electronic devices and circuits	621.3815 T14 SAG Principles of analog electronics	621.3815 T15 DUN Micromachining techniques and applications	Next

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